GA-2001-E Constant Temperature Test Chamber (80지)
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설명
GA-2001-E Constant Temperature Test Chamber (80지)
디자인 표준:
| GB11158 | 고온 테스트 챔버 기술 조건 |
| GB10589-89 | 저온 테스트 챔버 기술 조건 |
| GB10592-89 | 고저온 테스트 챔버 기술 조건 |
| GB/T10586-89 | 습열 테스트 챔버 기술 조건 |
| GB/T2423.1-2001 | 저온 테스트 챔버 테스트 방법 |
| GB/T2423.2-2001 | 고온 테스트 챔버 테스트 방법 |
| GB/T2423.3-93 | 습열 테스트 챔버 테스트 방법 |
| GB/T2423.4-93 | 습열 시험 방법의 교대 |
| GB/T2423.22-2001 | 온도 변화 테스트 방법 |
| IEC60068-2-1.1990 | 저온 테스트 챔버 테스트 방법 |
| IEC60068-2-2.1974 | 고온 테스트 챔버 테스트 방법 |
| GJB150.3 | 고온 테스트 방법 |
| GJB150.4 | 저온 테스트 방법 |
| ‘GJB150.9 | 습열 테스트 방법 |
GA-2001-E Constant Temperature Test Chamber (80지)
유sage introduction:
This test chamber provides high temperature, low temperature, high humidity, low humidity simulation environment, to detect rubber, 플라스틱, electronic products before and after the test of the material and strength of the decay degree. The machine can also simulate the container environment, to detect rubber, plastic under high temperature and humidity, fading, shrinkage situation. Test the heat resistance, cold resistance, dry resistance and moisture resistance of various materials. Suitable for electronics, electrical appliances, 배터리, universities, research institutes, inspection and quarantine bureau, paper products, 음식, vehicles, 자동차 부품, 금속, 화학적인, building materials and other industries factory unit quality control testing.
GA-2001-E Constant Temperature Test Chamber (80지)
매개변수
| 안건 | 설명 |
| Basic product introduction | |
| 이름 | constant temperature and humidity test chamber |
| 모델 | GA-2001-E-80Z |
| 수량 | 1 Piece |
| 상표 | GONOAVA |
| Satisfying criteria | 1.GB11158 Technical conditions of high-temperature test chamber
2. GB10589-89 Technical conditions of low temperature test chamber 3. GB10592-89 Technical conditions of high and low temperature test chamber 4.GB/T10586-89 Humidity and heat test chamber technical conditions 5.GB/T2423.1-2008 Low temperature test chamber test method 6. GB/T2423.2-2008 High temperature test chamber test method 7. GB/T2423.3-2006 Humid heat test chamber test method 8.GB/T2423.4-2008 Alternating humid heat test method 9. GB/T2423.22-2002 Test method for temperature change 10.IEC60068-2-1.1990 Low temperature test chamber test method 11. IEC60068-2-2.1974 High temperature test chamber test method 12. GJB150.3 high-temperature test 13. GJB150.4 low temperature test 14. GJB150.9 damp heat test |
| Descriptive use | This test chamber provides high temperature, low temperature, high humidity, low humidity simulation environment, to detect rubber, 플라스틱, electronic products before and after the test of the material and strength of the decay degree. The machine can also simulate the container environment, to detect rubber, plastic under high temperature and humidity, fading, shrinkage situation. Test the heat resistance, cold resistance, dry resistance and moisture resistance of various materials. Suitable for electronics, electrical appliances, 배터리, universities, research institutes, inspection and quarantine bureau, paper products, 음식, vehicles, 자동차 부품, 금속, 화학적인, building materials and other industries factory unit quality control testing.
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| 특징 | Perfect modeling design high texture appearance equipment noise small operation simple safe and reliable
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| Prohibited items of experimental equipment | 1. Test or store samples of flammable, explosive and volatile substances
2. Test or store corrosive substance samples 3. Testing or storage of biological samples 4. Testing or storage of samples of strong electromagnetic emission sources
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| Performance index | |
| Interior dimension
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(너비 * 키 * 깊이) 400mm*500mm*400mm |
| Carton size | (너비 * 키 * 깊이)）900×1450×1100 mm |
| Container Internal
용량
|
80엘 |
| 온도 범위 | -40℃ ~ +150℃ |
| 습도 범위 | 20～98% R•H adjustable |
| Temperature and humidity control range | |
| Control stability | temperature≤±0.5℃；humidity≤±2% |
| Equilibrium of distribution | temperature≤±1.5℃；humidity≤±3.0% |
| Heating up time | Average 2~5℃/ min, nonlinear no-load temperature rise |
| 냉각 시간 | Average 0.7~1℃/ min, nonlinear no-load cooling |
| Temperature limit | maximum temperature +150℃；minimum temperature -40℃ |
GA-2001-E Constant Temperature Test Chamber (80지)
