Descrizione

Transformer Test System

Caratteristiche

The test speed is as high as 1800 volte/s (>10kHz), without relay action time

Test level up to 20Vrms

The bias voltage is built-in ±40V/±100mA/2A

Fino a 288 test pins (only TH2840NX)

Industry-friendly user experience: Linux bottom layer, built-in help file

10.1 inch 1280×800 capacitive touch screen

Graphical pin association setting page, so that wiring is no longer a problem

Lk setting does not need to input the leakage inductance pin, which is more intuitive

Enhanced balance scanning function, from 5 points to 10 punti

Range switching adopts electronic switch, fast speed, long life, no noise

Optional LCR function

Approximately 100M setting file storage space in the machine, and massive U disk setting file storage capacity

Provide host computer to support early model file format conversion to ensure compatibility

 

Transformer Test System

Applicazioni

Switching transformer scanning test, comprehensive characteristics analysis.

Network transformer scanning test, comprehensive characteristics analysis

Discrete passive components (l, R, C) multi-channel scanning test

Relay drive line package, contact resistance multi-channel scanning test

Multi-channel DC resistance DCR scanning test

Comprehensive test analysis of multiple passive components in impedance network

Specifiche

Modello TH2840AX TH2840BX TH2840NX
Schermo Schermo 10.1″ Captive Touch Screen
Ratio 16:09
Risoluzione 1280×RGB×800
Test PIN 20PIN(By TH1806) 48PIN(Can extend to 288PIN)
Frequenza Allineare 20Hz-500kHz 20Hz-2MHz 20Hz-500kHz
Precisione 0.01%
Risoluzione 0.1mHz (20.0000Hz-99.9999Hz)
1mHz (100.000Hz-999.999Hz)
10mHz (1.00000kHz-9.99999kHz)
100mHz (10.0000kHz-99.9999kHz)
1Hz (100.000kHz-999.999kHz )
10Hz (1.00000MHz-2.00000MHz)