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TH2684 Megger Insulation Resistance Tester

Tonghui TH1778A DC Bias Current Source 0~20A TH1778AS
AT683 Insulation Resistance Tester

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Megger Insulation Resistance Tester

Brief Introduction

TH2684/TH2684A High Precision IR Tester is an intelligent measurement instrument that is used for rapid measurements on IR properties of electronic parts and components, dielectric materials, equipments, cables, dll.. Large LCD and user friendly menu provide you easier operation. This instrument is especially designed for capacitor IR test TH2684/TH2684A can achieve rapid measurements through following methods: 1. Selectable internal input impedance: If the current is greater than 10nA, only 10kΩ input impedance can be used; if the current is below 10nA, you can choose 10kΩ or 1MΩ impedance to test. 2. With the built-in dual voltage output, TH2684 can charge large capacitors. By dual voltage output, TH2684 is able to output a precharge voltage up to 500V, 200mA. In voltage follow mode, precharge voltage follow with the test voltage output and can be finely adjusted. Above features ensure the perfect charge of capacitive materials. 3. TH2684A can output a voltage of 1000V, 100mA to fully charge the capacitive material. Selain itu, user can program the sequence measurement steps (hingga 18 steps) on TH2684/TH2684A. For instance, charge, wait, tes, and discharge steps can be programmed. Each step can last up to 100s. TH2684/TH2684A has a unique contact detection function. For capacitive material such as capacitors and cables, contact detection function can detect the contact of components under test. Lebih-lebih lagi, this detection function will not increase any test time. TH2684 equips with interfaces of RS232, USB DEVICE, SCANNING and Handler. Handler interface provide convenience for automatic test system; SCANNING interface is useful for mass measurement of components. User can use a scanner to speed measurement of components.

Megger Insulation Resistance Tester

Model TH2684 TH2684A
Resistance Test
Jangkauan kΩ to 50TΩ kΩ to 100TΩ
Ketepatan Uji arus > 100pA: 2%Test current ≤ 100 pA: 2% ± Vtest/2pA
Current Test
Jangkauan Jangkauan 1 :100uA – 1mA , Internal Input impedance 10 kΩ
Jangkauan 2 :10uA – 100uA , Internal Input impedance 10 kΩ
Jangkauan 3 :1uA – 10uA , Internal Input impedance 10 kΩ
Jangkauan 4 :100nA – 1uA , Internal Input impedance 10 kΩ
Jangkauan 5 :10nA – 100nA, Internal Input impedance 10 kΩ
Jangkauan 6 :1nA – 10nA, Internal Input impedance 10 kΩ or 1MΩ (selectable)
Jangkauan 7 :10pA – 1nA, Internal Input impedance 10 kΩ or 1MΩ (selectable)
Ketepatan 2% ± 2pA
Measurement Voltage
Jangkauan 10 to 500V, 1V resolution to 1000V,1V resolution
Ketepatan 2% of readout,or ± 1V
Source Resistance 200Oh
Current Limit 2,25,or 200mA 2, 25 , or 100mA
Voltage Output Manually turn on or off on front panel, or controlled by built-in timer, or by remote control.
Timing Programmable charge time: 0 to 1000s
Measurement Delay 0 to 1000s programmable
Discharge Resistance 2kΩ
Discharge Time t = 0.03 x Cx (in μF), when Vtest falls to 1% of the test level.
Measurement Speed
Trig Mode Single measurement: < 100MS(exclude charge time)Average up to 100 pengukuran:<100+ (N-1) X 100 MS (exclude charge)
Continuous Mode Direct readout: 100ms – 10000ms depending on average number
Pembanding bins:(3 bins for PASS,1 bin for FAIL)
Range Mode Mobil, Memegang
Average Times to100
Memory Sets of setup values can be stored.
Standard Interface GPIB (opsional), RS232C, HANDLER interface output, USBDEVICE ( USBTMC and USBCDC support), USBHOST, SCANNING