The thickness of galvanized layer and passivation layer in galvanized sheet was measured by XRF fluorescence spectrometer EDX8000B

X-ray fluorescence spectroscopy thickness gauge has the advantages of accurate, fast, non-destructive and simultaneous measurement of multilayer metal coating thickness.

By measuring the XRF spectral line strength of zinc and silicon in the coating, we convert the thickness of galvanized layer and passivation layer, and use the standard curve method of FP no standard sample analysis software to establish the plating thickness analysis curve for measurement. The method is simple, the measurement time is short and the precision is high. The comparison analysis proves that this method can accurately measure the thickness and composition of galvanized layer and passivation layer in galvanized sheet

The thickness of galvanized layer and passivation layer in galvanized sheet was measured by XRF fluorescence spectrometer EDX8000B