TH2684 Megger Insulation Resistance Tester
- Opis
- Zapytanie
Opis
Megger Insulation Resistance Tester
Brief Introduction
TH2684/TH2684A High Precision IR Tester is an intelligent measurement instrument that is used for rapid measurements on IR properties of electronic parts and components, dielectric materials, equipments, kable, itp. Large LCD and user friendly menu provide you easier operation. This instrument is especially designed for capacitor IR test TH2684/TH2684A can achieve rapid measurements through following methods: 1. Selectable internal input impedance: If the current is greater than 10nA, only 10kΩ input impedance can be used; if the current is below 10nA, you can choose 10kΩ or 1MΩ impedance to test. 2. With the built-in dual voltage output, TH2684 can charge large capacitors. By dual voltage output, TH2684 is able to output a precharge voltage up to 500V, 200mama. In voltage follow mode, precharge voltage follow with the test voltage output and can be finely adjusted. Above features ensure the perfect charge of capacitive materials. 3. TH2684A can output a voltage of 1000V, 100mA to fully charge the capacitive material. Ponadto, user can program the sequence measurement steps (up to 18 steps) on TH2684/TH2684A. For instance, opłata, wait, test, and discharge steps can be programmed. Each step can last up to 100s. TH2684/TH2684A has a unique contact detection function. For capacitive material such as capacitors and cables, contact detection function can detect the contact of components under test. Ponadto, this detection function will not increase any test time. TH2684 equips with interfaces of RS232, URZĄDZENIE USB, SCANNING and Handler. Handler interface provide convenience for automatic test system; SCANNING interface is useful for mass measurement of components. User can use a scanner to speed measurement of components.
Megger Insulation Resistance Tester
| Model | TH2684 | TH2684A |
| Test odporności | ||
| Zakres | kΩ to 50TΩ | kΩ to 100TΩ |
| Dokładność | Test current > 100pA: 2%Test current ≤ 100 pA: 2% ± Vtest/2pA | |
| Aktualny test | ||
| Zakres | Zakres 1 :100uA – 1mA , Internal Input impedance 10 kΩ | |
| Zakres 2 :10uA – 100uA , Internal Input impedance 10 kΩ | ||
| Zakres 3 :1uA – 10uA , Internal Input impedance 10 kΩ | ||
| Zakres 4 :100nA – 1uA , Internal Input impedance 10 kΩ | ||
| Zakres 5 :10nA – 100nA, Internal Input impedance 10 kΩ | ||
| Zakres 6 :1nA – 10nA, Internal Input impedance 10 kΩ or 1MΩ (selectable) | ||
| Zakres 7 :10pA – 1nA, Internal Input impedance 10 kΩ or 1MΩ (selectable) | ||
| Dokładność | 2% ± 2pA | |
| Measurement Voltage | ||
| Zakres | 10 to 500V, 1V resolution | to 1000V,1V resolution |
| Dokładność | 2% of readout,or ± 1V | |
| Source Resistance | 200Oh | |
| Aktualny limit | 2,25,or 200mA | 2, 25 , or 100mA |
| Voltage Output | Manually turn on or off on front panel, or controlled by built-in timer, or by remote control. | |
| Timing | Programmable charge time: 0 to 1000s | |
| Measurement Delay | 0 to 1000s programmable | |
| Discharge Resistance | 2kΩ | |
| Discharge Time | t = 0.03 x Cx (in μF), when Vtest falls to 1% of the test level. | |
| Measurement Speed | ||
| Trig Mode | Single measurement: < 100ms(exclude charge time)Average up to 100 measurements:<100+ (N-1) X 100 ms (exclude charge) | |
| Continuous Mode | Direct readout: 100ms – 10000ms depending on average number | |
| Comparator | kosze:(3 bins for PASS,1 bin for FAIL) | |
| Tryb zasięgu | Automatyczny, Trzymać | |
| Average Times | to100 | |
| Memory | Sets of setup values can be stored. | |
| Standardowy interfejs | GPIB (opcjonalny), RS232C, HANDLER interface output, USBDEVICE ( USBTMC and USBCDC support), USBHOST, SCANNING | |
