GA-TQL50-1 Low Permeability Tester
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GA-TQL50-1 Low Permeability Tester

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GA-TQL50-1 Low Permeability Tester

Invoering

The GA-TQL50-1 Low Permeability tester uses new technology and the most common test methods to measure the permeability of thin films, papers, and other flake objects. This instrument is a special instrument for testing ultra-low wafer permeability. It is a fully automated instrument controlled by a single chip microcomputer. Its test methods meet the requirements of Schober and Bentsen and Gerlai and other methods, and it is an advanced instrument for testing air permeability in the plastic film, paper making, verpakking, medical and automotive industries, and its performance meets international standards.

 

Principle

According to the principle of pressure difference method, the pre-treated sample is placed between the upper and lower measurement surfaces, and a constant pressure difference is formed on both sides of the sample. Under the action of pressure difference, the gas flows from the high pressure side through the sample to the low pressure side, and the permeability of the sample is calculated according to the area, pressure difference and flow rate flowing through the sample.

Implementation standards:

GB/T458, ISO536/2, ISO536/3, ISO536/5, QB/T1667, GB/T22819, GB/T23227, ISO2965, GB/T12655

 

GA-TQL50-1 Low Permeability Tester

technische parameters:

Meetbereik (pressure difference 1kPa) : 0~6mL/min, 0.00001 ~ 0.1μm/(Pa•s), 0~ 1000000 s/100ml

Unit (vier) : μm/(Pa•s), CU, ml/min, S(Gurely)

Nauwkeurigheid: 10-6μm /Pa•s, 3× 10-5mL /min, 0.1S(Gurely)

Testgebied: 50cm²

Linear error: ≤1%

Test pressure difference: 0.05kPa ~ 4kPa

Stroomvoorziening: AC 220V±22V, 50Hz

Gewicht: over 28 kg

Touch screen Chinese and English display