IEC61032 Probe B Test Finger
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Jari Uji Probe B IEC61032

TIDAK 18 Jari Tes Anak TIDAK 18 Jari Tes Anak
Pemeriksaan IEC61032 11 Uji Jari Pemeriksaan IEC61032 11 Uji Jari

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Jari Uji Probe B IEC61032

Perkenalan

According to GB4706, GB2099, GB4943, GB/ t4208-2008ip2, GB3883 figure 1, IEC61032:1997 figure 2 test fixture B, IEC950 figure 2A, IEC60884, IEC60335, GB/T16842 test fixture B, UL507, EN60529 figure 1, UL1278 figure 8.4 standard model requirements design and manufacture.A protective test to prevent finger contact or electric shock.

Jari Uji Probe B IEC61032

Parameter teknik:

1, Knurled Finger Diameter:12mm

2, Knurled Finger Length :80mm

3, Baffle Plate Diameter :50mm

4, Baffle Plate Length : 100mm