TH2817B+ TH2817C+ LCR Digital Bridge Meter
- Paglalarawan
- Pagtatanong
Paglalarawan
LCR Meter
Mga Tampok
test frequency 50Hz,60Hz,100Hz,120Hz,1mga kHz,10mga kHz,20mga kHz,
40mga kHz, 50mga kHz,100mga kHz, total 10 mga puntos
4.3 inch TFT liquid crystal display
50Hz-100kHz, 10 typical test frequencies
6-digit reading resolution
Maximum test speed:12.5ms, support low frequency and high
bilis:TX4+3ms
Chinese and English optional operation interface
10 bins sorting, test sorting is more perfect
100 sets of LCRZ instrument setting files, 10 measurements
Soft power switch
Support 110V/220V two power supply voltages
10-point list scanning, support multi-frequency test sorting
Ultra-low signal source output offset (<100μV), meeting the
needs of large inductor, common mode choke inductor test
Super impact protection
Power on state lock button;
Empty fixture judgment
Data logging function
Screen capture function
Interface function, timing, trigger delay, atbp. are more complete
LCR Meter
Teknikal na Parameter
| Modelo | TH2817B+ | TH2817B | |
| Pangunahing Katumpakan | 0.1% | ||
| Test Frequency | 50Hz,60Hz,100Hz,120Hz,1mga kHz,10mga kHz,20mga kHz,40mga kHz, 50mga kHz,100mga kHz, total 10 mga puntos | ||
| Test Parameters | L, C, R,Z|, D, Q, X, θd, θr, Vm, Im, % | L, C, R,Z|, Q, D, X, θ | |
| V/I Monitor | Oo nga | —— | |
| AC Test Signal Level | 0.1Vrms,0.3Vrms,1Vrms | ||
| Test Terminal Configuration | 5-terminal | ||
| Test Speed (ms/time) | Fast: 19ms; Medium:83ms; Slow: 333msF≤120Hz Fast :4XT+3ms | Fast: 50ms; Medium:125ms; Slow: 500ms | |
| Zero Clearing | Open, Short, Load | Open, Short | |
| List Sweep | 10-point list sweepEach scan point can be individually sorted, support multi-frequency combined test sorting Scanning test for frequency and AC voltage | —— | |
| Equivalent Circuit | Series, Parallel | ||
| Range Mode | AUTO, HOLD | ||
| Trigger Mode | Internal, Panlabas na, Manwal, Bus | ||
| Average Times | 1-255 | —— | |
| Arithmetical Operation | Direct reading, ABS nga ba, % | Direct reading, % | |
| Delay | Trigger delay, step delay: 0—60.000s, 1ms step | —— | |
| General Function | Series, parallel equivalent mode, calibration: bukas na circuit, maikling sirkito, range selection: automatic na, manwal na manwal, trigger mode: INT, MAN, EXT, BUS, keyboard lock function | ||
| Comparator | bins sorting, BIN1-BIN9, NG, AUX; Bin count function PASS, FALL front panel LED display | bins sorting, PASS/FAIL instructions | |
| Memory | Nonvolatile Storage | sets of LCRZ instrument setting files | ten groups of the instrument setting file |
| USB Storage | Instrument setting files, measurement result CSV files | —— | |
| Interface | RS232/RS485(option), HANDLER, USB HOST, USB DEVICE | ||
