Popis

RoHS detector

1.Představení produktu:

The new generation of design, is a unique sense of science and technology of one-machine multi-purpose spectrometer, using advanced EFP algorithm and low-light clustering technology with a new generation of multi-channel timely sequencing, specialized type not only retains the performance of the special thickness gauge to detect small samples and grooves, but also can meet the micro-area RoHS detection and full element analysis. Every function is the most professional.

2.Výkonová výhoda

Micro sample detection Minimum measuring area 0.03mm² Zoom device algorithm The measuring distance can be changed to measure concave and convex shaped samples, and the zoom distance can reach 0-30mm Advanced EFP algorithm Li(3)-U(92) element coating, multiple layers of multiple elements, even the same element in different layers can be accurately measured Advanced spectrum resolution technology Reduce the interference of similar energy elements and reduce the detection limit High performance detector High performance SDD silicon drift detector with measurement accuracy up to nanometer level X-ray apparatus Microfocus enhanced ray tube with focusing device One machine multi-purpose, fine test fine test At the same time to meet the coating, RoHS, and alloy composition detection, and is the fine test, each use is professional grade

RoHS detector
3.Application field
entry

Modelové číslo

GA-161CS GA-1614C
Coating analysis It can analyze 23 coatings and 24 kinds of elements at the same time, and it can also analyze and detect 90 kinds of elements of Li(3)-U(92) coating with the same elements in different layers
RoHS analysis The minimum detection limit of harmful elements (RoHS, halogens) is 2ppm The minimum detection limit of harmful elements (RoHS, halogens) is 1ppm
Component Analysis S(16)-U(92) Al(13)-U(92)
EFP algorithm Standard
Software operation humanized closed software, automatically judge fault prompt correction and operation steps to avoid misoperation
Čas analýzy 3-200 sekundy 1-200 sekundy
Detektor Si-Pin semiconductor detector SDD Silicon drift detector
X-ray device Microfocus enhanced ray tube
kolimátor Standard: □0.1*0.3mm; Phi is 0.3 mm; Phi is 1.2 mm; φ3mm four collimator automatic switching

(Optional φ0.2mm; Phi is 0.5 mm; Phi is 1.2 mm; Phi is 3 mm)

 

Low light concentration technology recently measured the spot diffusion is less than 10%
Filtr Four kinds of filter freely switch
Measuring distance With distance compensation function, can change the measuring distance of concave and convex shaped samples, zoom distance 0-30mm
Sample observation 1/2.7 “color CCD, zoom function
Focusing mode Highly sensitive lens, manual focus
magnification Optical 38-46X, digital amplification 40-200 časy
Velikost nástroje 545mm*380mm*435mm
Sample chamber height 210mm
Sample table moving mode High precision XY manual slide rail
Movable range 50mm*50mm
weight of the instrument 50kg
Other accessories A set of computer, tiskárna, accessory box, 12-element sheet, RoHS standard sheet, electroplating solution measurement

Measuring cup (volitelný), standard plate (2 out of 10)

X-ray standards DIN ISO3497, Z 50987 and ASTMB568

RoHS detector