GA2661 Four Probe Resistivity Tester

представяне на продукт:

Precision four-probe resistivity tester can be selected according to different material characteristics. Tungsten carbide probe with high wear resistance to test the resistivity and square resistance of silicon semiconductors, graphene, thermal sensitive materials, metal conductive plastics and other hard materials; Spherical gold-plated copper probe probes are also available to test the resistivity and square resistance of semiconductor materials such as flexible conductive films, PE films, capacitive convolved films, metal foils, metal coatings, or carbon paper, films, керамика, ITO films on glass substrates, lithium battery electrode sheets, hydrogen fuel cell electrode sheets, or nanocoatings. The instrument is suitable for measuring the conductivity of conductors and semiconductor materials in semiconductor material factories, universities and scientific research institutions.